Light Analyzer with New Bi-Technology Sensor for LED, OLED & Light Source Measurement
Gigahertz-Optik's latest light detection technology overcomes the inherent limitations of both the traditional photometric & radiometric detector and the diode array spectrometer by integrating them to form one instrument for absolute accurate photometric, radiometric and colorimetric measurement of LEDs, OLEDs and lamps. Filter radiometers and photometers offer high sensitivity and large dynamic range plus simplicity and low cost. However measurement uncertainties of up to 30 % can occur when testing near-monochromatic light sources, like LEDs, in the blue or red spectral range. Current technology diode array based spectrometers provide wavelength distribution information but cannot match the sensitivity of broadband detectors for luminous flux or averaged LED intensity photometry.
The compact and modular X4 Light Analyzer is designed for use with a PC under remote control operation via USB interface with the supplied OS-X4 software for measurement and display of x,y and u’, v’ CIE chromaticity coordinates, dominant wavelength, complementary dominant wavelength, purity, correlated color temperature, color rendering index, irradiance (W/m²) and illuminance (lx).
The X4 simultaneously measures the light signal integrally and spectrally with a photopic and/or radiometric detector and a diode array spectrometer allowing an on-line correction calculation to yield a measurement uncertainty of less than two percent. Color coordinates are indicated with an accuracy of less than 0.005. Adding a Gigahertz-Optik integrating sphere expands the X4's capability to include luminous (lm) and radiant (W) flux measurement. Other available accessories allow average luminous intensity (cd) and luminance measurements to be performed.